Test report for single event effects of the 80386dx microprocessor

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National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology, National Technical Information Service, distributor , Pasadena, Calif, [Springfield, Va
StatementR. Kevin Watson, Harvey R. Schwartz, Donald K. Nichols.
SeriesNASA contractor report -- NASA CR-194509.
ContributionsSchwartz, Harvey R., Nichols, Donald K., Jet Propulsion Laboratory (U.S.)
The Physical Object
Pagination1 v.
ID Numbers
Open LibraryOL17679923M

The Jet Propulsion Laboratory Section Single Event Effects (SEE) Testing and Analysis Group has performed a series of SEE tests of certain strategic registers of Intel's DX CHMOS 4 microprocessor.

Following a summary of the test techniques and hardware used to gather the data, we present the SEE heavy ion and proton test :// Get this from a library. Test report for single event effects of the dx microprocessor.

[R Kevin Watson; Harvey R Schwartz; Donald K Nichols; Jet Propulsion Laboratory (U.S.)]   The Section Single Event Effects (SEE) Testing and Analysis Group has performed a series of SEE tests of certain strategic registers of Intel's DX CHMOS IV microprocessor.

Details Test report for single event effects of the 80386dx microprocessor EPUB

Following a summary of the test techniques and hardware used to gather the data, we present the SEE heavy ion and proton test results. We also describe the   SBC Test Method Types of SEUs Observed; Compare device data and address lines with known values stored in a PC.

Data - miscompare with stored data/address values; Lockup - single event functional interrupts (SEFI) requiring a reset signal to the device (HW or SW) to return to normal operations.; Lock-step comparison of two DUTs (data, address, and control lines).

Test report for single event effects of the dx microprocessor [microform] / R. Kevin Watson, Harvey Microprocessor systems; Microprocessor applications manual / Motorola Semiconductor Products Inc.

; contributors, Alvin W. Moore Microprocessor systems: software and hardware architecture / edited by Stephen Evanczuk Technical Report, R.A.

Reed, and L. Massengill, presented at the Single-Event Effects Symposium, La Jolla, CA, Rusapat Harnchotipun, “Microprocessor-Based digital Relay Laboratory,” Extended Abstract Presented at the ASEE South East Meeting, April JESD57 Test Standard, “Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy-Ion Irradiation” Revision Updates - SEE-MAPLD presentation Author: Jean-Marie Lauenstein   TID was noted.

All test articles were operational at the end of the test. • The MTBF for the UMC CPU Single Event Upset is years and the MTBF for the UMC CPU Functional Interrupt recovering automatically is years.

• Neither UMC PS1 efforts in preparing this book, they make no representations or warranties with respect to the accuracy or completeness of the contents of this book and specifically disclaim any implied warranties of merchantability or fitness for a particular purpose.

No warranty may be created or extended by sales representatives or written sales ?doi=&rep=rep1&type=pdf.

dw98, 5 LTC report, 6 AD report]. ADC and DAC are also very sensitive to SEEs: Single Event Transients (SET) in the analog part and Single Event Upsets (SEU) in the digital part.

SETs generally cause small deviations in the device output [7 Turf tns90, 8 Turf tns94], and SEUs may cause large variations of the device ://   Forrest M. Mims III, LED Sun Photometry, Optics and Photonics News, Vol. 20, Issue 9, pp. David R.

Brooks, Forrest M. Mims III, and Richard Roettger, Inexpensive Near-IR Sun Photometer for Measuring Total Column Water, Journal of Atmospheric and Oceanic Technol –, July Sarah A.

Mims and Forrest M.

Description Test report for single event effects of the 80386dx microprocessor FB2

Mims III, Fungal spores are transported long process management for avionics - atmospheric radiation effects - part 1: accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment: bs en space product assurance - electrical, electronic and electromechanical (eee) components: i.s.

The Z80 is an 8-bit microprocessor introduced by Zilog as the startup company's first product. The Z80 was conceived by Federico Faggin in late and developed by him and his 11 employees starting in early The first working samples were delivered in Marchand it was officially introduced on the market in July COVID Resources.

Reliable information about the coronavirus (COVID) is available from the World Health Organization (current situation, international travel).Numerous and frequently-updated resource results are available from this ’s WebJunction has pulled together information and resources to assist library staff as they consider how to handle coronavirus   Single Event Transient (SET) sensitivity and the potential for Multiple-bit Upset (MBU) effects.

In general, one can discuss the impact of these changes to radiation test and characterization as geometric or operational ://   A computer is a machine that can be instructed to carry out sequences of arithmetic or logical operations automatically via computer computers have the ability to follow generalized sets of operations, called programs.

These programs enable computers to perform an extremely wide range of :// Final report}, author = {}, abstractNote = {The overall objective of this characterization test was to determine the sensitivity of the Motorola bit microcontroller to radiation induced single event upset and latch-up (SEU/SEL).

The microcontroller is a key component of the GPS Receiver which will be a subsystem of the satellite   The authors have developed a system that tests microprocessors for single event upset (SEU) at the specified clock speed and without adding wait or hold states. This system compiles a detailed record of SEU induced errors and has been used to test the Sandia SA microprocessor and prototypes of its commercial equivalent, the Harris H80C85 at The Embedded Design Handbook complements the primary documentation for the Intel tools for embedded system development.

It describes how to most effectively use the tools, and recommends design styles and practices for developing, debugging, and optimizing embedded systems using Intel-provided handbook introduces concepts to new users of Intel ’s embedded solutions, and Ayatolahi et al.

[59] experimentally study the effects of single- and double-bit errors in instruction set architecture registers and main memory using fault injection. Fault injection is a method to test and assess the dependability (availability, reliability, and maintainability) and performance of fault-tolerant and fail-safe :// The design, implemented here on a nm bulk CMOS process, achieves unprecedented single event effects hardness and + MHz operating frequency at less than mW power :// Η δωρεάν υπηρεσία της Google μεταφράζει άμεσα λέξεις, φράσεις και ιστοσελίδες μεταξύ Αγγλικών και περισσότερων από άλλων γλωσσών.

Το ιστορικό μετάφρασης θα είναι σύντομα διαθέσιμο μόνο όταν είστε συνδεδεμένοι και θα ?hl=el&tab=wT. Figure illustrates the effects of adding derivative action.

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The pa-rameters. and. are chosen so that the closed-loop system is oscillatory. Damping increases with increasing derivative time, but decreases again when derivative time becomes too large. Recall that derivative action can~murray/courses/cds/fa02/caltech/ Commercial 65nm CMOS Technology for Space Applications: Heavy Ion, Proton and Gamma Test Results and Modeling", oral paper at the International Radiation Effects on Components and Systems (RADECS), Bruge, Sept S.

Uznanski, G. Gasiot, P. Roche, J-L. Autran, "Single Event Upset and Multiple Cell Upset   The MIT-BIH Arrhythmia Database was the first generally available set of standard test material for evaluation of arrhythmia detectors, and it has B. Liu, Soft failure detection and correction in microprocessor characterization, IEEE Proc.

of International Test Conference,pp. Google Scholar [4] Neutron Single Event Upsets in SRAM-Based FPGAs,” Xilinx High Reliable Products, Internal Report, (). Particle Correlator Instruments in Space: Performance Limitations Successes, and the Future,” American Geophysics Union, Santa Fe Chapman Conf.,   F.

Firouzi, M.E. Salehi, A. Azarpeyvand, S.M. Fakhraie, S. SafariAnalysis of single-event effects in embedded processors for non-uniform fault tolerant design Proceeding of the International Conference on Innovations in Information Technology, IIT’, IEEE (), pp.

Except for this section, this book contains U.S. and English language biases. However, the programming and design techniques described in the rest of this book are applied in pretty much the same way in non-U.S.

and non-English language editors. The first bias is the character set used to represent   Template:Distinguish Template:Short description Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation (particle radiation and high-energy electromagnetic radiation),Template:Cite encyclopedia especially for environments in outer space and high-altitude flight, around nuclear.

­The computer you are using to read this page uses a microprocessor to do its work. The microprocessor is the heart of any normal computer, whether it is a desktop machine, a server or a microprocessor you are using might be a Pentium, a K6, a PowerPC, a Sparc or any of the many other brands and types of microprocessors, but they all do approximately the same thing in approximately M.

Alderighi, F. Casini, S. D’Angelo, M. Mancini, S. Pastore, G.R. Sechi, R. Weigand, Evaluation of single event upset mitigation schemes for SRAM based FPGAs using the FLIPPER fault injection platform, in Proceedings of 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp.

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